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标题:透射电子显微学常用缩写词

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透射电子显微学常用缩写词

ACF        absorption correction factor
A/D        analog to digital (converter)
ADF        annular dark field
AEM        analytical electron microscope/microscopy
AES        Auger electron spectrometer/spectroscopy
AFF        aberration-free focus
ALCHEMI        atom location by channeling-enhanced microanalysis
APB        anti-phase domain boundary
ATW        atmospheric thin window
BF        bright field
BFP        back focal plane
BSE        backscattered electron
BSED        backscattered-electron diffraction
BZB        Brillouin-zone boundary
C(1,2,etc..)condenser (l, 2, etc.) lens
CB        coherent bremsstrahlung
CBED        convergent-beam electron diffraction
CBIM        convergent-beam imaging
CCD        charge-coupled device
CCF        cross-correlation function
CCM        charge-collection microscopy
CDF        centered dark field
CF        coherent Fennel/Foucault
CFEG        cold field-emission gun
CL        Cathodeoluminescence
CRT        cathode-ray tube
CS        crystallographic shear
CSL        coincident-site lattice
DF        dark field
DOS        density of states
DP        diffraction pattern
DQE        detection of quantum efficiency
DSTEM        dedicated scanning transmission electron microscopy
DTSA        desktop spectrum analyzer
EBIC        electron beam-induced current/conductivity
EELS        electron energy-loss spectrometry
EFI        energy-filtered imaging
ELNES        energy-loss near-edge structure
ELP        energy-loss program (Gatan)
EMMA        electron microscope microanalyzer
EMS         electron microscopy image simulation
EPMA        electron probe microanalyzer
ESCA        electron spectroscopy for chemical analysis
ESI        electron spectroscopic imaging
EXAFS        extended X-ray absorption fine structure
EXELFS        extended energy-loss fine structure
FCF        fluorescence correction factor
FEG        field-emission gun
FET        field-effect transistor
FFT        fast Fourier transform
FOLZ        first-order Laue zone
FSE        fast secondary electron
FTP        file transfer protocol
FWHM        full width at half maximum
FWTM        full width at tenth maximum
GB        grain boundary
GCS        generalized cross section
GIF        Gatan image filter
GOS        generalüed oscillator strength
HAADF        high-angle annular dark field
HOLZ        higher-order Laue zone
HPGe        high-purity germanium
HRTEM        high-resolution transmission electron microscope/microscopy
HV        high vacuum
HVEM        high voltage electron microscope/microscopy
IDB        inversion domain boundary
IEEE        International Electronics and Electrical Engineering
IG        intrinsic Ge
IVEM        intermediate voltage electron microscope/microscopy
K-M        Kossel-M?llenstedt
LEED        low-energy electron diffraction
LLS        linear least-squares
LUT        look-up table
MC        minimum contrast
MCA        multichannel analyzer
MDM        minimum detectable mass
MLS        multiple least-squares
MMF        minimum mass fraction
MSDS        material safety data sheets
NCEMSS        National Center for Electron Microscopy simulation system
NIH        National Institutes of Health
NIST        National Institute of Standards and Technology
OR        orientation relationship
OTEDP        oblique-textured electron diffraction pattern
PB        phase boundary
P/B        peak-to-background ratio
PEELS        parallel electron energy-loss spectrometer/spectroscopy
PIMS        Precision Ion-Milling System
PIPS        Precision Ion-Polishing System
PM        photomultiplier
POA        phase-object approximation
QHRTEM        quantitative high-resolution transmission electron microsc.
RB        translation boundary (yes, it does!)
RCP        rocking-beam channeling patterns
RDF        radial distribution function
REM        reflection electron microscope/microscopy
RHEED        reflection high-energy electron diffraction
RHF        relativistic Hartree-Fock
RHFS        relativistic Hartree-Fock-Slater
SAD        selected-area diffraction
SE        secondary electron
SEELS        serial electron energy-loss spectrometer/spectrometry
SEM        scanning electron microscope/microscopy
SF        stacking fault
SHRLI        simulated high-resolution lattice images
SIMS        secondary ion mass spectrometry
S/N        signal-to-noise ratio
SOLZ        second-order Laue zone
SRM        standard reference material
STEM        scanning transmission electron microscope/microscopy
STM        scanning tunneling microscope/microscopy
TB        twin boundary
TEM        transmission electron microscope/microscopy
TMBA        too many bloody acronyms
UHV        ultrahigh vacuum
UTW        ultra thin window
V/F        voltage to frequency (converter)
VLM        visible-light microscope/microscopy
WB        weak beam
WBDF        weak-beam dark field
WDS        wavelength-dispersive
WP        whole pattern
WPOA        weak-phase object approximation
WWW        World Wide Web
XANES        X-ray absorption near-edge structure
XEDS        X-ray energy-dispersive
XRD        X-ray diffraction
YBCO        yttrium-barium-copper oxide
YAG        yttrium-aluminum garnet
ZAF        atomic number, absorption, fluorescence correction
ZAP        zone-axis pattern
ZOLZ        zero-order Laue zone
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策马啸西风[使用道具]
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