题目:Quantitative XPS surface analysis: Correction for contamination layer
作者:T. Reich1 and V. I. Nefedov
杂志:Journal of Electron Spectroscopy and Related Phenomena
期卷号:Volume 56, Issue 1, February 1991, Pages 33-49作者: amelican_beauty 时间: 2010-1-13 11:54